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Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks
Custom Hardware Processor Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks
2009/9/4
A custom processor based on reconfigurable hardware technology is proposed in order to compute the figure of merit used to measure the quality of the fit of X-ray diffraction peaks. As the experimenta...
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction
Single and Dual Multilayer Optics Powder X-Ray Diffraction
2009/9/4
The performance of parallel beam multilayer optics, including a parabolic multilayer Osmic MaxFlux GO-13N and a flat custom multilayer, was evaluated experimentally and compared to Bragg-Brentano and ...