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Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements
Contribution of Ni KLL Auger Electrons the Conversion Electron Yield Measurements
2010/9/17
The averaged attenuation length of emitted electrons with the conversion electron yield (CEY) method was evaluated for Ni films with the x-rays below and above the Ni K absorption edge. The evaluated ...